INFLUENCE OF REABSORPTION ON THE DETERMINATION OF THE DIFFUSION LENGTH OF THE MINORITY CARRIERS (LD) IN LIGHTLY DOPEDGAAS BY THE METHOD OF AN ELECTRON-PROBE-INDUCED CURRENT.

被引：0

|

作者：

ZHOLUDEV, V.M.

KONNIKOV, S.G.

KONSTANTINOV, A.O.

SOBOLEV, M.M.

机构：

来源：

| 1982年 / V 16卷 / N 6期

关键词：

712 Electronic and Thermionic Materials;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

3

引用

收藏

页码：696 / 697

相关论文

共 35 条

[1] INFLUENCE OF REABSORPTION ON THE DETERMINATION OF THE DIFFUSION LENGTH OF THE MINORITY-CARRIERS (LD) IN LIGHTLY DOPED GAAS BY THE METHOD OF AN ELECTRON-PROBE-INDUCED CURRENT
ZHOLUDEV, VM
KONNIKOV, SG
KONSTANTINOV, AO
SOBOLEV, MM
SOVIET PHYSICS SEMICONDUCTORS-USSR, 1982, 16 (06): : 696 - 697
[2] A noncontact electron-probe method for measuring the diffusion length and the lifetime of minority charge carriers in semiconductors
Rau, ÉI
Zhu, SQ
SEMICONDUCTORS, 2001, 35 (06) : 718 - 722
[3] DETERMINATION OF DIFFUSION LENGTH OF ELECTRON-BEAM INDUCED MINORITY-CARRIERS IN POLYCRYSTALLINE GAAS
PAZ, O
BORREGO, JM
APPLIED PHYSICS LETTERS, 1983, 42 (11) : 958 - 960
[4] DETERMINATION OF THE DIFFUSION LENGTH OF THE MINORITY-CARRIERS BY THE METHOD OF ELECTROMODULATED PHOTOLUMINESCENCE
SAVCHENKO, AP
ZHIGULIN, SN
SOVIET PHYSICS SEMICONDUCTORS-USSR, 1988, 22 (03): : 339 - 340
[5] MEASUREMENT OF DIFFUSION LENGTH OF CURRENT CARRIERS IN SEMICONDUCTORS USING A MICROSCOPIC ELECTRON PROBE.
Ormont, A.B.
Instruments and experimental techniques New York, 1981, 24 (2 pt 2): : 508 - 511
[6] MEASUREMENT OF DIFFUSION LENGTH OF CURRENT CARRIERS IN SEMICONDUCTORS USING A MICROSCOPIC ELECTRON-PROBE
ORMONT, AB
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1981, 24 (02) : 508 - 511
[7] DETERMINATION OF MINORITY-CARRIER DIFFUSION LENGTH BY INTEGRAL PROPERTIES OF ELECTRON-BEAM-INDUCED CURRENT PROFILES
CAVALCOLI, D
CAVALLINI, A
CASTALDINI, A
JOURNAL OF APPLIED PHYSICS, 1991, 70 (04) : 2163 - 2168
[8] DETERMINATION OF DIFFUSION LENGTH OF MINORITY CARRIERS IN ELECTRON-BEAM-EXCITED N-TYPE GAAS
RAKSHIT, S
BISWAS, SN
CHAKRAVARTI, AN
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1971, 4 (01): : 249 - +
[9] Minority Carrier Diffusion Length Measurements in Solar Cells by Electron Beam Induced Current
Maximenko, Sergey I.
Walters, Robert J.
2015 IEEE 42ND PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2015,
[10] Electron beam induced current measurements of minority carrier diffusion length in gallium nitride
Chernyak, L
Osinsky, A
Temkin, H
Yang, JW
Chen, Q
Khan, MA
APPLIED PHYSICS LETTERS, 1996, 69 (17) : 2531 - 2533

← 1 2 3 4 →