Skillful de-embedding

被引：0
|
作者：
Besser, Les [1 ]
机构：
[1] Besser Assoc, Los Altos, United States
来源：
Applied microwave magazine | 1994年 / 6卷 / 04期
关键词：
Device under test - Error model - Skillful deembedding;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：86 / 94
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