Performance and reliability issues of SiC-Schottky diodes

被引：3
|
作者：
Rupp, Roland [1 ]
Treu, Michael [1 ]
Mauder, Anton [1 ]
Griebl, Erich [1 ]
Werner, Wolfgang [1 ]
Bartsch, Wolfgang [2 ]
Stephani, Dietrich [2 ]
机构：
[1] Power Semiconductor Group, Infineon Technologies, PS E, DE-80312 München, Germany
[2] Siemens AG, Corporate Technology, ZT EN, PO Box 3220, DE-91050 Erlangen, Germany
来源：
Materials Science Forum | 2000年 / 338卷
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