机构:
ST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, France
Univ Bordeaux 1, Lab IXL, F-33405 Talence, FranceST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, France
Raya, C.
Pourchon, F.
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h-index: 0
机构:
ST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, FranceST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, France
Pourchon, F.
Celi, D.
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ST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, FranceST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, France
Celi, D.
Laurens, M.
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ST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, FranceST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, France
Laurens, M.
Zimmer, T.
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Univ Bordeaux 1, Lab IXL, F-33405 Talence, FranceST Microelect, Cent Res & Dev, 850 Rue Jean Monnet, F-38926 Crolles, France
Zimmer, T.
ICMTS 2006: PROCEEDINGS OF THE 2006 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES,
2006,
: 35
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+
机构:
Max-Planck-Inst fuer Metallforschung, Stuttgart, West Ger, Max-Planck-Inst fuer Metallforschung, Stuttgart, West GerMax-Planck-Inst fuer Metallforschung, Stuttgart, West Ger, Max-Planck-Inst fuer Metallforschung, Stuttgart, West Ger