Scaling the challenge of embedded memory

被引：0
|
作者：
Jones, Mark-Eric [1 ]
机构：
[1] MoSys Inc
来源：
Electronic Engineering (London) | 2000年 / 72卷 / 878期
关键词：
Embedded memory - Multibank - Power consumption - Single transistor single capacitor bit cell;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：57 / 58
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