Quantitative analysis of HRTEM images from amorphous materials. I: about the estimation of Cs and δf from HRTEM diffractograms

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作者：
Baik, H.S. [1 ]
Epicier, T. [1 ]
Cappellen, E.Van [1 ]
机构：
[1] INSA de Lyon, Villeurbanne, France
来源：
EPJ Applied Physics | 1998年 / 4卷 / 01期
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页码：11 / 26
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