True atomic resolution under ambient conditions obtained by atomic force microscopy in the contact mode

被引：0
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作者：
Schimmel, Th. [1 ,2 ]
Koch, Th. [1 ]
Küppers, J. [1 ]
Lux-Steiner, M. [3 ,4 ]
机构：
[1] Experimentalphysik III, Universität Bayreuth, D-95440 Bayreuth, Germany
[2] Institut für Angewandte Physik, Universität Karlsruhe, D-76128 Karlsruhe, Germany
[3] Fakultät für Physik, Universität Konstanz, D-78434 Konstanz, Germany
[4] Hahn-Meitner-Institut, D-14109 Berlin, Germany
来源：
Applied Physics A: Materials Science and Processing | 1999年 / 68卷 / 04期
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页码：399 / 402
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