Logarithmic devices for investigation of the volt-ampere characteristics of semiconductor instruments

被引：0
|
作者：
Leont'ev, G.E. [1 ]
机构：
[1] Vil'nyusskij Univ, Vil'nyus, Lithuania
来源：
| 1996年
关键词：
Volt-ampere characteristics;
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摘要：
Two devices for investigation of the volt-ampere characteristics (VAC) of semiconductors instruments are described. The first device is intended for detecting the VAC in the semilogarithmic scale in the current range of 10-12 - 10-1 A. The second device is intended for detecting the dependence of the nonideality coefficient m of the exponential VAC on the voltage, applied to a measured element, or on the current in this element. When detecting the m coefficient in the current range of 10-11 - 10-1 A the measurement error does not exceed 2%.
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