Micromachined field emission devices

被引:0
|
作者
Cornell Univ, Ithaca, United States [1 ]
机构
来源
Microelectron Eng | / 1-4卷 / 523-526期
关键词
Computer simulation - Electrodes - Electron guns - Electronic properties - Microelectromechanical devices - Micromachining - Monte Carlo methods - Optical properties - Resistors - Semiconducting silicon - Tungsten;
D O I
暂无
中图分类号
学科分类号
摘要
We present the application of micromachining technology to silicon-based field emission devices. Silicide formation on the emitter is shown to lead to lower voltage emission. Integration of series resistors and heaters is achieved by silicon bulk-micromachining. Multiple levels of tungsten electrodes are integrated by surface micromachining. This allows the integration of an entire micromachined electron gun array (MEGA) on a single silicon substrate. We review simulation results to illustrate the electron-optical properties of MEGA and show fabrication results and emission data.
引用
收藏
相关论文
共 50 条
  • [31] Nanodiamond Vacuum Field Emission Integrated Devices
    Kang, W. P.
    Hsu, S. H.
    Ghosh, N.
    Davidson, J. L.
    Huang, J. H.
    Kerns, D. V.
    2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), 2012, : 88 - +
  • [32] Microstructured silicon surfaces for field emission devices
    Sotgiu, G
    Schirone, L
    APPLIED SURFACE SCIENCE, 2005, 240 (1-4) : 424 - 431
  • [33] Fabrication of Nanomaterial Devices for Field Emission Applications
    Choi, Yongho
    Kim, Kwang Hyun
    ADVANCED MATERIALS RESEARCH II, PTS 1 AND 2, 2012, 463-464 : 739 - +
  • [34] BURST NOISE IN FIELD EMISSION DEVICES.
    Bakhtizin, R.Z.
    Gots, S.S.
    Radio Engineering and Electronic Physics (English translation of Radiotekhnika i Elektronika), 1981, 26 (11): : 101 - 106
  • [35] Micromachining technology for lateral field emission devices
    Milanovic, V
    Doherty, L
    Teasdale, DA
    Parsa, S
    Pister, KSJ
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2001, 48 (01) : 166 - 173
  • [36] Low dimensional structures and devices: Micromachined devices - Introduction
    Henini, M
    Karam, JM
    MICROELECTRONICS JOURNAL, 1998, 29 (09) : 577 - 578
  • [37] Real time observation of micromachined field emission tips using transmission electron microscope
    Kakushima, K
    Hashiguchi, G
    Ataka, M
    Toshiyoshi, H
    Fujita, H
    Transducers '05, Digest of Technical Papers, Vols 1 and 2, 2005, : 867 - 870
  • [38] MODELING OF ELECTRON TRAJECTORIES IN FIELD-EMISSION DEVICES
    CADE, NA
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1989, (99): : 109 - 112
  • [39] Field emission magnetic sensors based on focusing devices
    Marqués, MI
    Serena, PA
    Nicolaescu, D
    Correia, A
    SOLID-STATE ELECTRONICS, 2001, 45 (06) : 977 - 986
  • [40] Development of in situ analyzer of field-emission devices
    Kawasaki, Michito
    He, Zhen
    Gotoh, Yasuhito
    Tsuji, Hiroshi
    Ishikawa, Junzo
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (02): : C2A77 - C2A82