Quantifying the thickness of magnetically active layers using x-ray resonant magnetic scattering

被引：0
|
作者：
机构：
[1] Barnes, B.M.
[2] Li, Z.
[3] Savage, D.E.
[4] Wiedemann, E.
[5] Lagally, M.G.
来源：
Barnes, B.M. | 1600年 / American Institute of Physics Inc.卷 / 95期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
相关论文
共 50 条
  • [1] Quantifying the thickness of magnetically active layers using x-ray resonant magnetic scattering
    Barnes, BM
    Li, Z
    Savage, DE
    Wiedemann, E
    Lagally, MG
    JOURNAL OF APPLIED PHYSICS, 2004, 95 (11) : 6654 - 6656
  • [2] SURFACE X-RAY RESONANT MAGNETIC SCATTERING
    FASOLINO, A
    CARRA, P
    ALTARELLI, M
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1993, 121 (1-3) : 194 - 196
  • [3] RESONANT X-RAY MAGNETIC SCATTERING IN HOLMIUM
    GIBBS, D
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1992, 104 : 1489 - 1495
  • [4] Quantifying vibronic coupling with resonant inelastic X-ray scattering
    Gilmore, Keith
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2022, 25 (01) : 217 - 231
  • [5] Magnetic structure determination using polarised resonant X-ray scattering
    Hatton, P. D.
    Johnson, R. D.
    Bland, S. R.
    Mazzoli, C.
    Beale, T. A. W.
    Du, C. -H.
    Wilkins, S. B.
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2009, 321 (07) : 810 - 813
  • [6] Soft X-ray resonant magnetic scattering of magnetic nanostructures
    van der Laan, Gerrit
    COMPTES RENDUS PHYSIQUE, 2008, 9 (5-6) : 570 - 584
  • [7] Diffractometer for soft x-ray resonant magnetic scattering
    Grabis, J
    Nefedov, A
    Zabel, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (09): : 4048 - 4051
  • [8] Resonant X-ray magnetic scattering: antiferromagnetic metals
    Bernhoeft, N
    JOURNAL OF ALLOYS AND COMPOUNDS, 2000, 303 : 472 - 479
  • [9] X-RAY RESONANT MAGNETIC SCATTERING FROM SURFACES
    FASOLINO, A
    CARRA, P
    ALTARELLI, M
    PHYSICAL REVIEW B, 1993, 47 (07): : 3877 - 3881
  • [10] Resonant x-ray magnetic scattering from CoO
    Igarashi, J
    Takahashi, M
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 2000, 69 (12) : 4087 - 4094
12345