Equivalent circuit modeling of discharge current injected in contact with an ESD-gun

被引:0
|
作者
Fujiwara, Osamu [1 ]
Tanaka, Hideyuki [1 ]
Yamanaka, Yukio [2 ]
机构
[1] Nagoya Institute of Technology, Japan
[2] Communications Research Laboratory, Japan
关键词
Coaxial cables - Electric currents - Electric discharges - Electric potential - Electromagnetic fields - Frequencies - Semiconductor devices - Signal interference - Waveform analysis;
D O I
暂无
中图分类号
学科分类号
摘要
The transient electromagnetic (EM) fields caused by an electrostatic discharge (ESD) have broadband frequency spectra, which cause serious failure to high-tech information equipment. From this perspective, ESD testing for the EM immunity of the equipment is specified by IEC 61000-4-2, in which the detailed waveform of the discharge current injected onto the IEC recommended Pellegrini target in contact with an ESD-gun is prescribed for calibration. However, the factors for determining the current waveform remain unclear, and thus the IEC prescribed current waveform is unlikely to be injected into actual equipment, In this study, based on the structure of an ESD-gun, an equivalent circuit modeling is proposed for analyzing the discharge current injected onto a 50-Ω SMA connector instead of the IEC target that has frequency-dependent transmission characteristics. Its validity is confirmed by comparing the calculated current waveform with the measured result. The proposed circuit modeling is also validated from measurement of the discharge current injected onto a transmission line by the ESD-gun. © 2004 Wiley Periodicals, Inc.
引用
下载
收藏
页码:8 / 14
相关论文
共 50 条
  • [1] Equivalent circuit modeling of discharge current injected in contact with an ESD-gun
    Fujiwara, O
    Tanaka, H
    Yamanaka, Y
    ELECTRICAL ENGINEERING IN JAPAN, 2004, 149 (01) : 8 - 14
  • [2] A circuit approach to simulate discharge current injected in contact with an ESD-gun
    Tanaka, H
    Fujiwara, O
    Yamanaka, Y
    2002 3RD INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, 2002, : 486 - 489
  • [3] Variations in discharge current waveforms and their power spectra injected from contact discharges of ESD-gun with different arrangements
    Taka, Yoshinori
    Fujiwara, Osamu
    ELECTRICAL ENGINEERING IN JAPAN, 2012, 180 (01) : 9 - 14
  • [4] Variations in discharge current waveforms and its power spectra injected from contact discharges of ESD-gun with different arrangements
    Taka, Yoshinori
    Fujiwara, Osamu
    IEEJ Transactions on Fundamentals and Materials, 2011, 131 (05) : 384 - 388
  • [5] Rise time limit of discharge current for air discharge of an ESD-gun
    Mori, Ikuko
    Fujiwara, Osamu
    Ishigami, Shinobu
    CEEM' 2006: ASIA-PACIFIC CONFERENCE ON ENVIRONMENTAL ELECTROMAGNETICS, VOLS 1 AND 2, PROCEEDINGS, 2006, : 34 - +
  • [6] Estimation of Rise Time of Discharge Current for Air Discharge of ESD-Gun with Low Charge Voltages
    Mori, Ikuko
    Fujiwara, Osamu
    PRZEGLAD ELEKTROTECHNICZNY, 2010, 86 (03): : 54 - 56
  • [7] Characteristic measurement of discharge current injected by the air discharge of an ESD gun onto a ground
    Mori, Ikuko
    Fujiwara, Osamu
    Ishigami, Shinobu
    Yamanaka, Yukio
    ELECTRICAL ENGINEERING IN JAPAN, 2007, 158 (04) : 51 - 59
  • [8] Characteristic measurement of discharge current injected by the air discharge of an ESD gun onto a ground
    Mori, Ikuko
    Fujiwara, Osamu
    Ishigami, Shinobu
    Yamanaka, Yukio
    1600, John Wiley and Sons Inc., P.O.Box 18667, Newark, NJ 07191-8667, United States (158):
  • [9] Unified Circuit Modeling Technique for the Simulation of Electrostatic Discharge (ESD) Injected by an ESD Generator
    Sekine, Tadatoshi
    Asai, Hideki
    Lee, John S.
    2012 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC), 2012, : 340 - 345
  • [10] Modeling an ESD Gun Discharge to a USB Cable
    Xu, Yang
    Zhou, Jianchi
    Beetner, Daryl
    Meiguni, Javad
    Pommerenke, David
    Bub, Sergej
    Holland, Steffen
    2022 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & SIGNAL/POWER INTEGRITY, EMCSI, 2022, : 309 - 314