Carbon nanotube 'T junctions': nanoscale metal-semiconductor-metal contact devices

被引：0
|
作者：
Menon, Madhu [1 ]
Srivastava, Deepak [1 ]
机构：
[1] Univ of Kentucky, Lexington, United States
来源：
| 1997年 / Am Inst Phys, Woodbury, NY, United States卷 / 79期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
17
引用
收藏
相关论文
共 50 条
  • [1] Carbon nanotube ''T junctions'': Nanoscale metal-semiconductor-metal contact devices
    Menon, M
    Srivastava, D
    PHYSICAL REVIEW LETTERS, 1997, 79 (22) : 4453 - 4456
  • [2] TUNNELLING IN METAL-SEMICONDUCTOR-METAL JUNCTIONS
    NAFARI, N
    MEHBOD, M
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1979, 12 (23): : 5311 - 5322
  • [3] NANOSCALE TERA-HERTZ METAL-SEMICONDUCTOR-METAL PHOTODETECTORS
    CHOU, SY
    LIU, MY
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 1992, 28 (10) : 2358 - 2368
  • [4] Metal-semiconductor-metal transition in zigzag carbon nanoscrolls
    Dong, Haixia
    Zhang, Yang
    Fang, Dangqi
    Gong, Baihua
    Zhang, Erhu
    Zhang, Shengli
    NANOSCALE, 2016, 8 (05) : 2887 - 2891
  • [5] NOTE ON EFFECT OF BAND STRUCTURE ON TUNNELLING IN METAL-SEMICONDUCTOR-METAL JUNCTIONS
    GUNDLACH, KH
    PHYSICA STATUS SOLIDI, 1968, 30 (02): : K135 - &
  • [6] Electronic transport properties of carbon nanotube based metal/semiconductor/metal intramolecular junctions
    Triozon, F
    Lambin, P
    Roche, S
    NANOTECHNOLOGY, 2005, 16 (02) : 230 - 233
  • [7] The electrodeposition of metal at metal/carbon nanotube junctions
    Austin, DW
    Puretzky, AA
    Geohegan, DB
    Britt, PF
    Guillorn, MA
    Simpson, ML
    CHEMICAL PHYSICS LETTERS, 2002, 361 (5-6) : 525 - 529
  • [8] Evidence of edge conduction at nanotube/metal contact in carbon nanotube devices
    Nosho, Yosuke
    Ohno, Yutaka
    Kishimoto, Shigeru
    Mizutani, Takashi
    Japanese Journal of Applied Physics, Part 2: Letters, 2007, 46 (17-19):
  • [9] Evidence of edge conduction at nanotube/metal contact in carbon nanotube devices
    Nosho, Yosuke
    Ohno, Yutaka
    Kishimoto, Shigeru
    Mizutani, Takashi
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2007, 46 (17-19): : L474 - L476
  • [10] Metal-semiconductor-metal photodetectors
    Berger, PR
    TESTING RELIABILITY AND APPLICATIONS OF OPTOELECTRONIC DEVICES, 2001, 4285 : 198 - 207
12345