Thickness dependence of giant magnetoresistance effect in granular Cu-Co thin films

被引：0
|
作者：
Malkiński, L.M. [1 ]
Wang, J.-Q. [1 ]
Seip, C.T. [1 ]
Wiemann, J. [1 ]
Wiley, J.B. [1 ]
机构：
[1] Adv. Materials Research Institute, University of New Orleans, New Orleans, LA 70148, United States
来源：
Journal of Applied Physics | 1999年 / 85卷 / 8 II A期
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页码：4471 / 4473
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