A new focused ion beam optical system for a time-of-flight-secondary ion mass spectrometry instrument

被引：0
|
作者：
Central Research Laboratory, Hitachi Ltd., Kokubunji, Tokyo, 185, Japan [1 ]
机构：
来源：
RAPID COMMUN. MASS SPECTROM. | / 2卷 / 175-178期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] A new focused ion beam optical system for a time-of-flight-secondary ion mass spectrometry instrument
    Shichi, H
    Osabe, S
    Kanehori, A
    RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 1997, 11 (02) : 175 - 178
  • [2] Combined electron and focused ion beam system for improvement of secondary ion yield in secondary ion mass spectrometry instrument
    Ji, L.
    Ji, Q.
    Leung, K. -N.
    Gough, R. A.
    APPLIED PHYSICS LETTERS, 2006, 89 (16)
  • [3] Improvement of biological time-of-flight-secondary ion mass spectrometry imaging with a bismuth cluster ion source
    Touboul, D
    Kollmer, F
    Niehuis, E
    Brunelle, A
    Laprévote, O
    JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 2005, 16 (10) : 1608 - 1618
  • [4] Aberration-corrected focused ion beam for time-of-flight secondary neutral mass spectrometry
    Nagata, Kosuke
    Bajo, Ken-ichi
    Itose, Satoru
    Matsuya, Miyuki
    Ishihara, Morio
    Uchino, Kiichiro
    Yurimoto, Hisayoshi
    APPLIED PHYSICS EXPRESS, 2019, 12 (08)
  • [5] Time of flight secondary ion mass spectrometry
    不详
    AMERICAN CERAMIC SOCIETY BULLETIN, 2012, 91 (01): : 34 - 34
  • [6] Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry to Depth Profile Nanoparticles in Polymer Nanocomposites
    Zhang, Aria C.
    Maguire, Shawn M.
    Ford, Jamie T.
    Composto, Russell J.
    MICROSCOPY AND MICROANALYSIS, 2023,
  • [7] Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry to Depth Profile Nanoparticles in Polymer Nanocomposites
    Zhang, Aria C.
    Maguire, Shawn M.
    Ford, Jamie T.
    Composto, Russell J.
    MICROSCOPY AND MICROANALYSIS, 2023, : 1557 - 1565
  • [8] Characterization of adsorbed protein films using time-of-flight-secondary ion mass spectrometry and multivariate analysis
    Wagner, MS
    Castner, DG
    APPLIED SURFACE SCIENCE, 2003, 203 : 698 - 703
  • [9] Time-of-Flight-Secondary Ion Mass Spectrometry and Principal Component Analysis: Determination of Structures of Lamellar Surfaces
    Lau, Yiu-Ting R.
    Weng, Lu-Tao
    Ng, Kai-Mo
    Chan, Chi-Ming
    ANALYTICAL CHEMISTRY, 2010, 82 (07) : 2661 - 2667
  • [10] Salt Effects on Ion Formation in Desorption Mass Spectrometry: An Investigation into the Role of Alkali Chlorides on Peak Suppression in Time-of-Flight-Secondary Ion Mass Spectrometry
    Piwowar, Alan M.
    Lockyer, Nick P.
    Vickerman, John C.
    ANALYTICAL CHEMISTRY, 2009, 81 (03) : 1040 - 1048
12345