MAXIMUM ALLOWABLE PERCENT DEFECTIVE (MAPD) SINGLE SAMPLING INSPECTION BY ATTRIBUTES PLAN.

被引:0
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作者
Soundararajan, V.
机构
来源
Journal of Quality Technology | 1975年 / 7卷 / 04期
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D O I
10.1080/00224065.1975.11980694
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摘要
Single Sampling Attributes Plans indexed by Maximum Allowable Percent Defectives (MAPD) are given. A table, for transition from one set of parameters to match the Operating Characteristic Curve (OC curve) to other similar sets, is given.
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页码:173 / 182
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