New formula for effective dielectric constant in multi-dielectric layer microstrip structure

被引：0
|
作者：
Yoon, Yeong J. [1 ]
Kim, Bruce [1 ]
机构：
[1] SyChip, Warren, United States
来源：
IEEE Topical Meeting on Electrical Performance of Electronic Packaging | 2000年
关键词：
Computer simulation - Dielectric materials - Multilayers - Permittivity;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A simple expression of effective dielectric constant for microstrip on a multi-layered substrate is derived with the quasi-TEM assumption and the superposition of partial capacitance. Our method for a single-layer substrate provides difference within 2.32 percent compared to full-wave simulation. For the double layer case, our results are less than 2.2% in difference with an enhanced spectral domain technique and 1.6% with a variation method.
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页码：163 / 167
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