Optical characterization of Ru2Si3 by spectroscopic ellipsometry, UV-VIS-NIR spectroscopy and band structure calculations

被引：0
|
作者：
Henrion, W. [1 ]
Rebien, M. [1 ]
Antonov, V.N. [1 ]
Jepsen, O. [1 ]
Lange, H. [1 ]
机构：
[1] Hahn-Meitner-Inst, Berlin, Germany
来源：
Thin Solid Films | 1998年 / 313-314卷 / 1-2期
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页码：218 / 221
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