Structure characterization of coated materials by X-ray diffractometry

被引：0

作者：

Roentgendiffraktometrische Strukturcharakterisierung beschichteter Werkstoffe ^{[1
]}

机构：

[1] Oettel, Heinrich

来源：

Oettel, Heinrich | 1600年 / 34期

关键词：

Coatings;

D O I：

暂无

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学科分类号：

摘要：

引用

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[1] STRUCTURE CHARACTERIZATION OF COATED MATERIALS BY X-RAY-DIFFRACTOMETRY
OETTEL, H
NEUE HUTTE, 1989, 34 (03): : 111 - 115
[2] Characterization of the structure of ultradispersed diamond using X-ray diffractometry and small-angle X-ray scattering
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[3] Characterization of the structure of ultradispersed diamond using X-ray diffractometry and small-angle X-ray scattering
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[4] X-RAY TOPOGRAPHY AND PRECISION DIFFRACTOMETRY OF SEMICONDUCTING MATERIALS
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[5] X-RAY TOPOGRAPHY AND PRECISION DIFFRACTOMETRY OF SEMICONDUCTING MATERIALS
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[7] SIGNIFICANT STRUCTURE IN POLYMERS, MEASUREMENT BY X-RAY DIFFRACTOMETRY
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BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (03): : 317 - 318
[8] CHARACTERIZATION OF OXIDE SUPERCONDUCTOR BY MEANS OF X-RAY-DIFFRACTOMETRY AND X-RAY ABSORPTION NEAR EDGE STRUCTURE
KIMURA, M
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[9] Characterization of the structure of porous germanium layers by high-resolution X-ray diffractometry
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[10] Structure characterization of (Al,Ga)N epitaxial layers by means of X-ray diffractometry
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