TRIGGERING MECHANISMS IN TRIGGERED VACUUM GAPS.

被引：0
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作者：
Boxman, Raymond L. [1 ]
机构：
[1] High Power Laboratory, General Electric Company, Philadelphia, PA, United States
来源：
IEEE Transactions on Electron Devices | 1977年 / ED-24卷 / 02期
关键词：
Engineering Village;
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页码：122 / 128
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