Precision measurements of the absolute photoionization cross sections of He

被引：0

作者：

Samson, J.A.R. ^{[1
]}

He, Z.X. ^{[1
]}

Yin, L. ^{[1
,2
]}

Haddad, G.N. ^{[1
,3
]}

机构：

[1] Behlen Laboratoiy of Physics, University of Nebraska, Lincoln, NE 68506, United States

[2] Shanghai Institute of Optics and Fine Mechanics, Academia Sinica, PO Box 8211, Shanghai, China

[3] CSIRO, Division of Applied Physics, PO Box 218, Lindfield, NSW 2080, Australia

来源：

Journal of Physics B: Atomic, Molecular and Optical Physics | 1994年 / 27卷 / 05期

关键词：

COMPTON - Critical review - Ionization thresholds - Photoionization cross section - Precision measurement - Rayleigh;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：887 / 898

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