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- [2] Materials characterization and device analysis for evaluation of semiconductor processes by highly-sophisticated photoelastic stress measurement technique PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 12, NO 8, 2015, 12 (08): : 1085 - 1089
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- [7] Analytical Method for Selecting a Rectification Technique for a Piezoelectric Generator based on Admittance Measurement 13TH INTERNATIONAL CONFERENCE ON MICRO AND NANOTECHNOLOGY FOR POWER GENERATION AND ENERGY CONVERSION APPLICATIONS (POWERMEMS 2013), 2013, 476
- [8] Investigation of cross sensitivity of single and double electrode of admittance type level measurement 2012 SIXTH INTERNATIONAL CONFERENCE ON SENSING TECHNOLOGY (ICST), 2012, : 234 - 237
- [9] MEASUREMENT AND REGULATION TECHNIQUE Level measurement, part 2 KEMIJA U INDUSTRIJI-JOURNAL OF CHEMISTS AND CHEMICAL ENGINEERS, 2021, 70 (5-6): : 361 - 364