RANDOM TESTING MAY BE BETTER THAN YOU THINK.

被引：0
|
作者：
Duran, Joe W.
Wiorkowski, John J.
机构：
来源：
Proceedings of the Texas Conference on Computing Systems | 1979年
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
It is possible to calculate confidence bounds on computer program reliability from the results of random testing and also from the results of program path testing, if certain reasonable conditions hold. It is shown here that the extra effort and expense of path testing does not necessarily give higher confidence in program reliability and will in some cases give lower confidence. Further, it is argued that other testing methods such as segment testing may also be inferior in some respects to random testing.
引用
收藏
页码：6 / 6
相关论文
共 50 条
12345