Fabrication and ellipsometric investigation of thin films of rare-earth oxides

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作者：
Fursenko, O.V. [1 ]
Semikina, T.V. [1 ]
Shmyrjeva, A.N. [1 ]
机构：
[1] Natl Acad of Sciences of Ukraine, Kyiv, Ukraine
来源：
Diffusion and Defect Data Pt.B: Solid State Phenomena | 1998年 / 63-64卷
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页码：341 / 346
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