Structural, aging, annealing & electrical properties of perylene thin films

Perylene thin film capacitors were fabricated onto well cleaned glass substrates with aluminium thin films as top and bottom electrodes under vacuum using thermal evaporation. From X-ray analysis, it has been found that perylene thin film poseesses crystalline structure. Aging and annealing studies were carried out. The dependence of capacitance and loss tangent on frequency, for different temperature, after annealing were investigated and the results are discussed. The process of ac conduction has been explained on the basis of hopping conduction mechanism. The activation energy and temperature coefficient of capacitance have been estimated. The study of dc conduction reveals that the conduction mechanism is space charge limited. The activation energy, free-carrier mobility, concentration of charge carriers, effective density of states in the conduction band and density of trapped electrons in the process have also been calculated.