Two-step methodology for CMOS VLSI reliability improvement: Step one

被引：0
|
作者：
Davies, M.S. [1 ]
Miles, R.E. [1 ]
Postoyalko, V. [1 ]
机构：
[1] Univ of Leeds, United Kingdom
来源：
Quality and Reliability Engineering International | 1988年 / 4卷 / 04期
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摘要：
32
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页码：317 / 329
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