Temperature effects of γ-irradiated metal-oxide-semiconductor field-effect-transistor

被引：0
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作者：
Wang, Jian-Ping
Xu, Na-Jun
Zhang, Ting-Qing
Tang, Hua-Lian
Liu, Jia-Lu
Liu, Chuan-Yang
Yao, Yu-Juan
Peng, Hong-Lun
He, Bao-Ping
Zhang, Zheng-Xuan
机构：
[1] Microelectronics Research Institute, Xidian University, Xi'an 710071, China
[2] Northwest Nucl. Technology Institute, Xi'an 710024, China
来源：
Wuli Xuebao/Acta Physica Sinica | 2000年 / 49卷 / 07期
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