FUNCTIONAL TESTING'S PLACE IN ELECTRONICS MANUFACTURING.

被引：0
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作者：
Turino, Jon [1 ]
机构：
[1] Logical Solutions Inc, Campbell, CA,, USA, Logical Solutions Inc, Campbell, CA, USA
来源：
Evaluation Engineering | 1984年 / 23卷 / 08期
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PRINTED CIRCUITS
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页码：58 / 61
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