Lateral and depth distribution of defects in ultra-fine grained copper prepared by high-pressure torsion

被引：0
|
作者：
Cizek, J. [1 ]
Prochazka, I. [1 ]
Brauer, G. [2 ]
Anwand, W. [2 ]
Kuzel, R. [1 ]
Cieslar, M. [1 ]
Islamgaliev, R.K. [3 ]
机构：
[1] Faculty of Mathematics and Physics, Charles University in Prague, V Holesovickach 2, CZ-180 00 Praha 8, Czech Republic
[2] Inst. F. Ionenstrahlphysik und M., Forschungszentrum Rossendorf, Postfach 510119, D-01314, Dresden, Germany
[3] Inst. of Phys. of Advanced Materials, Ufa State Aviat. Tech. University, Ufa 450000, Russia
来源：
Journal of Metastable and Nanocrystalline Materials | 2003年 / 17卷
关键词：
Dislocations (crystals) - Doppler effect - Materials testing - Microhardness - Plastic deformation - Spectroscopic analysis - Synchrotron radiation - Torsional stress - Transmission electron microscopy - X ray diffraction analysis;
D O I：
10.4028/www.scientific.net/JMNM.17.23
中图分类号：
学科分类号：
摘要：
Ultra-fine grained copper prepared by high-pressure torsion has been studied by means of positron annihilation spectroscopy techniques (slow positron implantation spectroscopy, conventional positron lifetime and Doppler broadening measurements) combined with transmission electron microscopy, X-ray diffraction and microhardness measurements. Dislocations in distorted regions along grain boundaries and microvoids of size of 3-4 vacancies inside grains were identified and their lateral distribution and depth profile were investigated in detail. The concentration of microvoids has been found to decrease with depth and to vary slightly with the distance from specimen axis, being lowest in the centre of the specimen disk. No position dependence of the concentration of dislocations was observed.
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页码：23 / 28
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