Observation of the photovoltaic and related effects in porous silicon by scanning tunneling microscopy

被引：0
|
作者：
Univ of Turku, Turku, Finland [1 ]
机构：
来源：
Thin Solid Films | / 1-2卷 / 138-141期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Observation of the photovoltaic and related effects in porous silicon by scanning tunneling microscopy
    Laiho, R
    Pavlov, A
    Pavlova, Y
    THIN SOLID FILMS, 1997, 297 (1-2) : 138 - 141
  • [2] SCANNING PROBE MICROSCOPY AND SCANNING TUNNELING SPECTROSCOPY OF POROUS SILICON
    AMISOLA, GB
    BEHRENSMEIER, R
    GALLIGAN, JM
    OTTER, FA
    NAMAVAR, F
    KALKORAN, NM
    APPLIED PHYSICS LETTERS, 1992, 61 (21) : 2595 - 2597
  • [3] Observation of silicon surface nanoholes by scanning tunneling microscopy
    Ozaki, N
    Ohno, Y
    Tanbara, M
    Hamada, D
    Yamasaki, J
    Takeda, S
    SURFACE SCIENCE, 2001, 493 (1-3) : 547 - 554
  • [4] SCANNING-TUNNELING-MICROSCOPY OF POROUS SILICON SURFACES
    AMISOLA, GB
    BEHRENSMEIER, R
    GALLIGAN, JM
    OTTER, FA
    NAMAVAR, F
    KALKORAN, NM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (05): : 1788 - 1792
  • [5] NANOSTRUCTURING OF POROUS SILICON USING SCANNING-TUNNELING-MICROSCOPY
    DUMAS, P
    GU, M
    SYRYKH, C
    HALLIMAOUI, A
    SALVAN, F
    GIMZEWSKI, JK
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 2067 - 2069
  • [6] DIRECT OBSERVATION OF SILICON SURFACE ETCHING BY WATER WITH SCANNING TUNNELING MICROSCOPY
    PIETSCH, GJ
    KOHLER, U
    HENZLER, M
    CHEMICAL PHYSICS LETTERS, 1992, 197 (4-5) : 346 - 351
  • [7] SCANNING TUNNELING MICROSCOPY OF SILICON SURFACES IN AIR - OBSERVATION OF ATOMIC IMAGES
    NAKAGAWA, Y
    ISHITANI, A
    TAKAHAGI, T
    KURODA, H
    TOKUMOTO, H
    ONO, M
    KAJIMURA, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01): : 262 - 265
  • [8] In situ ultraviolet illumination of porous silicon during scanning tunneling microscopy
    Schwall, D.
    Otter, F.A.
    Galligan, J.M.
    Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena, 1998, 16 (04):
  • [9] Stable nanostructuring of ultrathin porous silicon films by scanning tunneling microscopy
    Enachescu, M
    Hartmann, E
    Koch, F
    JOURNAL OF APPLIED PHYSICS, 1996, 79 (06) : 2948 - 2953
  • [10] In situ ultraviolet illumination of porous silicon during scanning tunneling microscopy
    Schwall, D
    Otter, FA
    Galligan, JM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04): : 2127 - 2129
12345