DIFFUSION OF Cd AND Zn INTO InP AND InGaAsP (Eg equals 0. 95-1. 35 ev).

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Matsumoto, Yoshishige
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  • [1] DIFFUSION OF CD AND ZN INTO INP AND INGAASP (EG=0.95-1.35EV)
    MATSUMOTO, Y
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (11): : 1699 - 1704
  • [2] EFFECT OF ZN AND MN ON CD-TE BOND STRENGTH IN Cd1 - xZnxTe(X equals 0. 04 plus or minus 0. 01) AND Cd1 - xMnxTe(X equals 0. 1 plus or minus 0. 005).
    Qadri, S.B.
    Skelton, E.F.
    Webb, A.W.
    Kennedy, J.
    [J]. Physica B: Physics of Condensed Matter & C: Atomic, Molecular and Plasma Physics, Optics, 1985, 139-140 : 341 - 342
  • [3] Cd和Zn在InP和InGaAsP中的扩散(Eg=0.95~1.35eV)
    Yashishige Matsumoto
    赵旭霞
    [J]. 微纳电子技术, 1985, (03) : 13 - 19
  • [4] LIQUID PHASE EPITAXIAL GROWTH OF InGaAsP ON GaAs1 - yPy SUBSTRATES (y equals 0. 31 AND 0. 39).
    Fujimoto, Akira
    Shimura, Mikihiko
    Watanabe, Hideaki
    Takeuchi, Masashi
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1987, (05): : 675 - 681
  • [5] X-RAY SPECTROSCOPIC STUDY OF THE VALENCE BAND STRUCTURE OF Cd1 - xMnxTe,x equals 0. 6.
    Zahorowski, W.
    Gilberg, E.
    [J]. 1600, (52):
  • [6] VIBRATIONAL STUDY OF METAL-SUBSTITUTED MPS3 LAYERED COMPOUNDS: M1 - XIIM2XIPS3 WITH MII equals Mn, Cd, AND MI equals Cu (x equals 0. 13) OR Ag (X equals 0. 50): II. LOW-FREQUENCY RAMAN STUDY AND IONIC TRANSPORT.
    Poizat, O.
    Fillaux, F.
    Sourisseau, C.
    [J]. Journal of Solid State Chemistry, 1988, 72 (02) : 283 - 292
  • [7] Structural quality of pseudomorphic Zn0.5Cd0.5Se layers grown on an InGaAs or InP buffer layer on (0 0 1)InP substrates
    Philips Research, Briarcliff Manor, United States
    [J]. J Cryst Growth, 1-2 ([d]83-92):
  • [8] Structural quality of pseudomorphic Zn0.5Cd0.5Se layers grown on an InGaAs or InP buffer layer on (0 0 1)InP substrates
    Snoeks, E
    Zhao, L
    Yang, B
    Cavus, A
    Zeng, L
    Tamargo, MC
    [J]. JOURNAL OF CRYSTAL GROWTH, 1997, 179 (1-2) : 83 - 92
  • [9] TIME-OF-FLIGHT MEASUREMENT OF THE TOTAL CROSS SECTION FOR ELASTIC SCATTERING OF LOW-ENERGY ELECTRONS (E equals 0. 025-1. 0 eV) BY He, Ne, Ar, Kr, AND Xe.
    Gus'kov, Yu.K.
    Savvov, R.V.
    Slobodyanyuk, V.A.
    [J]. 1978, 23 (02): : 167 - 171
  • [10] REFRACTORY P-OHMIC-CONTACT TO GAAS AND GAXAL1 - XAS (X 0. 3) BASED ON DIFFUSION OF ZN IN A RAPID THERMAL FURNANCE.
    Tiwari, Sandip
    Hintzman, Jeffrey
    Callegari, Alessandro
    Wright, Steven
    [J]. IEEE Transactions on Electron Devices, 1987, ED-34 (11)