Probabilistic analysis of fault detection in complex logic circuits

被引：0
|
作者：
Fahmy, Hossam M.A.
Abdel-Zaher, Tarek F.
机构：
来源：
AEJ - Alexandria Engineering Journal | 1994年 / 33卷 / 01期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] PROBABILISTIC SCHEME SPEEDS FAULT GRADING FOR LOGIC-CIRCUITS
    BURSKY, D
    ELECTRONIC DESIGN, 1985, 33 (18) : 37 - 38
  • [2] MULTIPLE FAULT DETECTION FOR COMBINATIONAL LOGIC CIRCUITS
    YAU, SS
    YANG, SC
    IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (03) : 233 - 242
  • [3] Integration of fault detection and diagnosis in a probabilistic logic framework
    Garza, LE
    Cantú, F
    Acevedo, S
    ADVANCES IN ARTIFICIAL INTELLIGENCE - IBERAMIA 2002, PROCEEDINGS, 2002, 2527 : 265 - 274
  • [4] Probabilistic approach for yield analysis of dynamic logic circuits
    Brusamarello, Lucas
    da Silva, Roberto
    Wirth, Gilson I.
    Reis, Ricardo A. L.
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2008, 55 (08) : 2238 - 2248
  • [5] Reliability Analysis of Logic Circuits Using Probabilistic Techniques
    Grandhi, Satish
    Spagnol, Christian
    Popovici, Emanuel
    2014 10TH CONFERENCE ON PH.D. RESEARCH IN MICROELECTRONICS AND ELECTRONICS (PRIME 2014), 2014,
  • [6] GRAPH THEORETICAL AND PROBABILISTIC APPROACH TO FAULT DETECTION OF DIGITAL CIRCUITS
    RAULT, JC
    COMPUTER, 1971, 4 (01) : 40 - &
  • [7] The probabilistic logic for nanosize circuits
    Lu, Xiaojun
    Song, Xiaoyu
    Li, Jianping
    2007 INTERNATIONAL SYMPOSIUM ON INTEGRATED CIRCUITS, VOLS 1 AND 2, 2007, : 263 - +
  • [8] Probabilistic fault detection and the selection of measurements for analog integrated circuits
    Wang, ZH
    Gielen, G
    Sansen, W
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1998, 17 (09) : 862 - 872
  • [9] Probabilistic transfer matrices in symbolic reliability analysis of logic circuits
    Krishnaswamy, Smita
    Viamontes, George F.
    Markov, Igor L.
    Hayes, John P.
    ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2008, 13 (01)
  • [10] THE COMPLEXITY OF FAULT-DETECTION PROBLEMS FOR COMBINATIONAL LOGIC-CIRCUITS
    FUJIWARA, H
    TOIDA, S
    IEEE TRANSACTIONS ON COMPUTERS, 1982, 31 (06) : 555 - 560
12345