共 50 条
- [2] SURFACE PHOTOVOLTAGE MEASUREMENT IN MOS STRUCTURES. Applied physics. A, Solids and surfaces, 1987, A44 (02): : 191 - 194
- [3] THICKNESS MEASUREMENT OF THIN FILMS IN MULTILAYER STRUCTURES. IBM Technical Disclosure Bulletin, 1974, 16 (11): : 3604 - 3605
- [4] Power measurement of flexural waves in structures. Intensity in beams Proceedings - International Conference on Noise Control Engineering, 1988,
- [5] Measurement of spontaneous emission spectra of diode laser structures. LEOS 2001: 14TH ANNUAL MEETING OF THE IEEE LASERS & ELECTRO-OPTICS SOCIETY, VOLS 1 AND 2, PROCEEDINGS, 2001, : 655 - 656
- [6] MEASUREMENT OF THE DOPANT DISTRIBUTION IN THIN EPITAXIAL SI AND GaAs STRUCTURES. Periodica Polytechnica Electrical Engineering, 1980, 24 (1-2): : 11 - 18