Complex ATM testing - the simple way

被引：0
|
作者：
Arweiler, Hans Werner [1 ]
机构：
[1] Siemens AG, Berlin, Germany
来源：
Telcom Report (English Edition) | 1994年 / 17卷 / 06期
关键词：
ATM analyzers - ATM cell - Binomial distribution;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：44 / 45
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