Nanoscale patterning of Au films on Si surfaces by atomic force microscopy

被引：0
|
作者：
Moon, Won-Chul [1 ]
Yoshinobu, Tatsuo [1 ]
Iwasaki, Hiroshi [1 ]
机构：
[1] Inst. of Sci. and Indust. Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1999年 / 38卷 / 12 A期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：6952 / 6954
相关论文
共 50 条
  • [1] Nanoscale patterning of Au films on Si surfaces by atomic force microscopy
    Moon, WC
    Yoshinobu, T
    Iwasaki, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (12A): : 6952 - 6954
  • [2] Lift-off patterning of thin Au films on Si surfaces with atomic force microscopy
    Moon, W
    Yoshinobu, T
    Iwasaki, H
    [J]. ULTRAMICROSCOPY, 2000, 82 (1-4) : 119 - 123
  • [3] Nanoscale patterning of polymer surfaces using atomic force microscopy.
    Gannepalli, A
    Porter, MD
    Mallapragada, SK
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 215 : U280 - U280
  • [4] Nanoscale materials patterning and engineering by atomic force microscopy nanolithography
    Xie, X. N.
    Chung, H. J.
    Sow, C. H.
    Wee, A. T. S.
    [J]. MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2006, 54 (1-2): : 1 - 48
  • [5] Patterning at the nanoscale: Atomic force microscopy and extreme ultraviolet interference lithography
    Parisse, P.
    Luciani, D.
    D'Angelo, A.
    Santucci, S.
    Zuppella, P.
    Tucceri, P.
    Reale, A.
    Ottaviano, L.
    [J]. MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 2009, 165 (03): : 227 - 230
  • [6] SiO2 and Si nanoscale patterning with an atomic force microscope
    Klehn, B
    Kunze, U
    [J]. SUPERLATTICES AND MICROSTRUCTURES, 1998, 23 (02) : 441 - 444
  • [7] Nanoscale study of cartilage surfaces using atomic force microscopy
    Wang, Meiling
    Peng, Zhongxiao
    Watson, Jolanta A.
    Watson, Gregory S.
    Yin, Ling
    [J]. PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART H-JOURNAL OF ENGINEERING IN MEDICINE, 2012, 226 (H12) : 899 - 910
  • [8] Nanoscale patterning of adsorbed amphiphile films with an atomic force microscope probe
    Sakai, H
    Yokoyama, W
    Rathman, JF
    Abe, M
    [J]. LANGMUIR, 2003, 19 (07) : 2845 - 2850
  • [9] Nanoscale patterning of Si(100) surfaces by scratching through the native oxide layer using atomic force microscope
    Santinacci, L
    Djenizian, T
    Schmuki, P
    [J]. APPLIED PHYSICS LETTERS, 2001, 79 (12) : 1882 - 1884
  • [10] Nanoscale Patterning in crosslinked methacrylate copolymer networks: an atomic force Microscopy study
    Ye, Qiang
    Spencer, Paulette
    Wang, Yong
    [J]. JOURNAL OF APPLIED POLYMER SCIENCE, 2007, 106 (06) : 3843 - 3851
12345