High-accuracy thickness gauge by means of radioisotope

被引：0
|
作者：
Geng, Shijun [1 ]
Li, Gengli [1 ]
机构：
[1] Hebei Machine-Electrical Engineering, Coll, China
来源：
Wusun jiance | 1988年 / 10卷 / 06期
关键词：
Computers; Microcomputer--Control - Mechanical Variables Measurement--Computer Interfaces;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The principle and performance of the β-ray thickness gage controlled by microcomputer are described. The gage is used not only for dynamic display of the thickness of a wide film, but also for on-line control of the thickness. The test parameters are also given.
引用
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页码：167 / 168
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