Selective oxidation of vanadium thin film surfaces using an atomic force microscope

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ATR Adaptive Communications Research, Lab, Kyoto, Japan ^{[1
]}

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Conf Optoelectron Microelectron Mater Dev Proc COMMAD | / 419-421期

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[1] TIP ARTIFACTS IN ATOMIC-FORCE MICROSCOPE IMAGING OF THIN-FILM SURFACES
WESTRA, KL
MITCHELL, AW
THOMSON, DJ
[J]. JOURNAL OF APPLIED PHYSICS, 1993, 74 (05) : 3608 - 3610
[2] Nano-oxidation of vanadium thin films using atomic force microscopy
Vaccaro, PO
Sakata, S
Yamaoka, S
Umezu, I
Sugimura, A
[J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1998, 17 (22) : 1941 - 1943
[3] Measurement of the loss tangent of a thin polymeric film using the atomic force microscope
McGuiggan, PM
Yarusso, DJ
[J]. JOURNAL OF MATERIALS RESEARCH, 2004, 19 (01) : 387 - 395
[4] Nanostructures fabrication on Ta thin film using atomic force microscope lithography
Lee, S
Lee, H
Lee, DH
Park, BJ
Yeom, GY
[J]. MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 2006, 445 (115/[405]-118/[408]) : 115 - 118
[5] Measurement of the loss tangent of a thin polymeric film using the atomic force microscope
P. M. McGuiggan
D. J. Yarusso
[J]. Journal of Materials Research, 2004, 19
[6] PZT thin film actuator/sensor for atomic force microscope
Watanabe, S
Fujiu, T
[J]. ISAF '96 - PROCEEDINGS OF THE TENTH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2, 1996, : 199 - 204
[7] ATOMIC-FORCE MICROSCOPE TIP RADIUS NEEDED FOR ACCURATE IMAGING OF THIN-FILM SURFACES
WESTRA, KL
THOMSON, DJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3176 - 3181
[8] Characterisation of the mechanical properties of thin film cantilevers with the atomic force microscope
CSIRO Div of Chemicals and Polymers, Clayton
[J]. Materials Science Forum, 1995, 189-190 : 107 - 114
[9] Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope
Du, BY
VanLandingham, MR
Zhang, QL
He, TB
[J]. JOURNAL OF MATERIALS RESEARCH, 2001, 16 (05) : 1487 - 1492
[10] Observation on Surface and Cross Section of Thin Film Solar Cells Using Atomic Force Microscope
FENG Liang-huan
[J]. Semiconductor Photonics and Technology, 2005, (02) : 111 - 115

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