LSI TESTING METHODS AND EQUIPMENT.

被引：0

作者：

Bergman, Richard H.

Mayhew, Tom R.

机构：

来源：

RCA Engineer | 1980年 / 26卷 / 02期

关键词：

INTEGRATED CIRCUITS - Large Scale Integration;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

An examination is made of methods and equipment needed to test complex LSI devices, and delve into the functional test vectors portion of the electrical test specification, the design-for-testability issue, the SSTC test facility's effort to maintain compatibility with its customers and a review of SSTC's test equipment acquisition plans.

引用

页码：53 / 57

共 50 条

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