Framing systems for microelectronic facilities

被引:0
|
作者
Charlton, Nathan T. [1 ]
机构
[1] KPFF Consulting Engineers, Portland, United States
来源
Modern Steel Construction | 1997年 / 37卷 / 05期
关键词
Health hazards - Industrial plants - Load limits - Microelectronics - Roofs - Steel beams and girders - Steel structures - Strength of materials - Structural frames - Structural loads - Trusses - Vibration control;
D O I
暂无
中图分类号
学科分类号
摘要
Microelectronics facility structural framing system selection can be driven by a fast track design schedule for material fabrication, delivery and erection, longspan framing requirements for column free manufacturing space and vibration sensitive design criteria. Microelectronics facilities are very specialized, single-use, high-bay facilities which typically incorporate long span trusses, extraordinarily sensitive vibration design criteria and heavy equipment loads. They are classified by the Uniform Building Code as hazardous occupancy facilities which lead to explosion venting design and damage limiting construction for areas used for storing volatile gasses subject to conflagration.
引用
收藏
页码:66 / 76
相关论文
共 50 条
  • [1] Undergraduate microelectronic engineering programs and laboratory facilities
    Fuller, Lynn
    Biennial University/Government/Industry Microelectronics Symposium - Proceedings, 1999, : 1 - 5
  • [2] Microelectronic systems education
    Hudson, Tina A.
    IEEE TRANSACTIONS ON EDUCATION, 2008, 51 (03) : 305 - 305
  • [3] VIBRATION ON VARIOUS FLOOR TYPES IN MICROELECTRONIC FABRICATION FACILITIES
    SILVER, W
    SZYMKOWIAK, EA
    9TH INTERNATIONAL SYMPOSIUM ON CONTAMINATION CONTROL : EXPLORING WORLD PARTNERSHIPS IN TECHNOLOGY, 1988, : 187 - 191
  • [4] Microelectronic Systems Education
    Hudson, Tina A.
    IEEE TRANSACTIONS ON EDUCATION, 2011, 54 (02) : 173 - 173
  • [5] Analysis of the Spread of Harmful Impurities in the Atmosphere from Microelectronic Facilities
    Gundartcev, Mikhail A.
    Riabyshenkov, Andrei S.
    Gundartcev, Andrei A.
    Sharaeva, Valeria
    Karakeyan, Valery, I
    PROCEEDINGS OF THE 2021 IEEE CONFERENCE OF RUSSIAN YOUNG RESEARCHERS IN ELECTRICAL AND ELECTRONIC ENGINEERING (ELCONRUS), 2021, : 2799 - 2802
  • [6] Microelectronic systems education in the US
    Bouldin, DW
    MICROELECTRONICS EDUCATION, 1998, : 183 - 186
  • [7] Trends on microelectronic systems education
    Teixeira, IC
    Teixeira, JP
    MICROELECTRONICS EDUCATION, 1998, : 117 - 120
  • [8] Testing microelectronic biofluidic systems
    Kerkhoff, Hans G.
    IEEE DESIGN & TEST OF COMPUTERS, 2007, 24 (01): : 72 - 82
  • [9] RADIATION RESISTANCE OF MICROELECTRONIC SYSTEMS
    TIAINEN, OJA
    JAUHO, P
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1970, NS17 (04) : 3 - &
  • [10] ASSEMBLY AND INSPECTION OF MICROELECTRONIC SYSTEMS
    TEEL, KS
    SPRINGER, RM
    SADLER, EE
    HUMAN FACTORS, 1968, 10 (03) : 217 - &