Pentium Pro processor design for test and debug

被引：0
|
作者：
Carbine, Adrian [1 ]
Feltham, Derek [1 ]
机构：
[1] Intel Corp
来源：
IEEE Design and Test of Computers | 1998年 / 15卷 / 03期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
10
引用
收藏
页码：77 / 82
相关论文
共 50 条
  • [1] Pentium® Pro processor design for test and debug
    Carbine, A
    Feltham, D
    ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY, 1997, : 294 - 303
  • [2] Pentium pro processor design for test and debug
    Carbine, A
    Feltham, D
    IEEE DESIGN & TEST OF COMPUTERS, 1998, 15 (03): : 77 - 82
  • [3] The design of an efficient simulator for the Pentium pro processor
    Sykes, DA
    Malloy, BA
    1996 WINTER SIMULATION CONFERENCE PROCEEDINGS, 1996, : 840 - 847
  • [4] Paging extensions for the Pentium pro processor
    Collins, RR
    DR DOBBS JOURNAL, 1996, 21 (07): : 107 - 111
  • [5] An overview of the Pentium(R)Pro processor bus
    Sarangdhar, N
    Singh, G
    DIGEST OF PAPERS: COMPCON SPRING 96, FORTY-FIRST IEEE COMPUTER SOCIETY INTERNATIONAL CONFERENCE - INTELLECTUAL LEVERAGE, 1996, : 383 - 387
  • [6] Performance characterization of the Pentium(R) Pro processor
    Bhandarkar, D
    Ding, J
    THIRD INTERNATIONAL SYMPOSIUM ON HIGH-PERFORMANCE COMPUTER ARCHITECTURE - PROCEEDINGS, 1997, : 288 - 297
  • [7] PENTIUM PROCESSOR THERMAL DESIGN GUIDELINES
    MCCUTCHAN, DR
    REILLY, JW
    MICROPROCESSORS AND MICROSYSTEMS, 1994, 18 (04) : 231 - 237
  • [8] Pentium(R)Pro Processor workstation/server PCI Chipset
    Bell, M
    Holman, T
    DIGEST OF PAPERS: COMPCON SPRING 96, FORTY-FIRST IEEE COMPUTER SOCIETY INTERNATIONAL CONFERENCE - INTELLECTUAL LEVERAGE, 1996, : 388 - 394
  • [9] Pentium 4 processor package design and development
    Hasan, A
    Sathe, A
    Wood, D
    Viswanath, R
    53RD ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2003 PROCEEDINGS, 2003, : 1431 - 1439
  • [10] Interconnect and noise immunity design for the Pentium® 4 processor
    Kumar, R
    40TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2003, 2003, : 938 - 943
12345