Effect of helium gas pressure on X-ray mask heating during synchrotron radiation exposure

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[1] Chiba, Akira
[2] Futagami, Motonobu
[3] Okada, Koichi
[4] Kato, Tadao
[5] Atoda, Nobufumi
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Chiba, Akira | 1600年 / JJAP, Minato-ku, Japan卷 / 34期
关键词：
Fourier transform infrared spectroscopy - Heat transfer - Helium - Masks - Membranes - Pressure effects - Silicon nitride - Storage rings - Synchrotron radiation - Tantalum - Thermal effects - Thermography (temperature measurement);
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