BACK PRESSURE SENSE CIRCUIT.

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作者：
Appenzeller, H.A.
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来源：
IBM Technical Disclosure Bulletin | 1975年 / 18卷 / 02期
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摘要：
Ultralow pressure fluidic devices are extremely susceptable to supply pressure fluctuations, hose lengths, sense orifice diameters etc. This is especially true in a back pressure sense circuit, where an object covers an orifice and the resulting back pressure trips the fluidic device. It is shown how the addition of a ″venturi Tee″ into the circuit makes it immune to the above conditions.
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页码：422 / 424
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