MEASUREMENT OF ELECTRON MOBILITY IN p-Si BY TIME-OF-FLIGHT TECHNIQUE.

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作者：
Morohashi, Makoto [1 ]
Sawaki, Nobuhiko [1 ]
Akasaki, Isamu [1 ]
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[1] Nagoya Univ, Dep of Electronics,, Nagoya, Jpn, Nagoya Univ, Dep of Electronics, Nagoya, Jpn
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| 1600年 / 24期
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