共 50 条
- [7] High resolution x-ray diffraction and x-ray topography study of GaN on Al2O3 WIDE-BANDGAP SEMICONDUCTORS FOR HIGH POWER, HIGH FREQUENCY AND HIGH TEMPERATURE, 1998, 512 : 315 - 320
- [8] Comparative application of measuring techniques for X-ray analysis of grinding residual stresses in Al2O3 and AlN Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques, 2000, 91 (11): : 967 - 975
- [9] Comparative application of measuring techniques for X-ray analysis of grinding residual stresses in Al2O3 and AlN ZEITSCHRIFT FUR METALLKUNDE, 2000, 91 (11): : 967 - 975
- [10] Numerical models for thermal residual stresses in Al2O3 platelets/borosilicate glass matrix composites MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 323 (1-2): : 246 - 250