INAP conformance test system development and verification using IUT simulator

被引：0
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作者：
Bae, Seongyong [1 ]
Bae, Hyunjoo [1 ]
Cho, Sehyeong [1 ]
机构：
[1] Electronics and Telecommunications, Research Inst, Taejon, Korea, Republic of
来源：
Conference Record / IEEE Global Telecommunications Conference | 1998年 / 6卷
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页码：3356 / 3361
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