In-guide pump and probe characterization of photoinduced absorption in hydrogenated amorphous silicon thin films

被引：0
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作者：
Della Corte, Francesco Giuseppe [1 ]
Gagliardi, Masslmo [2 ]
Nigro, Maria Arcangela [1 ]
Summonte, Caterina [3 ]
机构：
[1] Department of Information Science, Mathematics, Electronics and Transportations (DIMET), Mediterranen University, Via Graziella Localita Feo di Vito, I-89060 Reggio Calabria, Italy
[2] Institute of Microelectronics and Microsystems (IMM), National Council of Research, Via Castellino 111, I-80131 Napoli, Italy
[3] Institute of Microelectronics and Microsystems (IMM), National Council of Research, Via Gobetti 101, 1-40129 Bologna, Italy
来源：
Journal of Applied Physics | 2006年 / 100卷 / 03期
关键词：
The in-guide pump and probe analysis illustrated in this paper is useful for the characterisation of photoinduced phenomena in thin films that are already part of an optoelectronic device. Measurements were carried on a-Si:H/ZnO waveguiding multilayers designed for the telecommunication wavelength of 1.55 μm. Because of the waveguiding geometry; the probe beam propagates along the film under test; a configuration that allows two advantages. First; the underlying layers do not affect the acquisition; and therefore the use of a transparent substrate is not necessary. Second; a longer region is available for the interaction between the pump and probe beams with respect to normal incidence probe beam setups; a characteristic conferring a high sensitivity to the technique. An analysis of the experimental data is proposed to extract information on the material; independent; e.g; of the device geometry. As an example; we illustrate an analysis of the photoinduced absorption by starting from measures directly performed on the a-Si : H core of an operating waveguide. © 2006 American Institute of Physics;
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