Investigation of the heteroepitaxial CdHgTe structures by spectroscopic ellipsometry

被引：0
|
作者：
Skrebneva, P.S. [1 ]
Burlakov, I.D. [1 ,2 ]
Iakovleva, N.I. [1 ]
机构：
[1] ORION R and P Association, 46/2 Entuziastov highway, Moscow,111123, Russia
[2] Moscow State Technical University of Radio Engineering, Electronics and Automation, 78 Vernadsky av., Moscow,119454, Russia
来源：
Applied Physics | 2014年 / 05期
关键词：
II-VI semiconductors;
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摘要：
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页码：61 / 66
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