The electric properties of the medium inside the crack effects on the electric-field-induced domain evolution in ferroelectric

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[1] Huang, Cheng
[2] Yuan, Zhenyu
[3] Wang, Xiaojun
[4] Guo, Hun
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Huang, Cheng (huangcheng@czu.cn); Guo, Hun (guoh@czu.cn) | 1600年 / Trans Tech Publications Ltd卷 / 866期
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10.4028/www.scientific.net/KEM.866.96
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