Self-calibration phase-shifting digital holographic microscopy based on carrier frequency analysis

被引：0
|
作者：
Xu, Zhennan [1 ,2 ]
Zhong, Jingang [1 ,2 ]
机构：
[1] Department of Optoelectronic Engineering, Jinan University, Guangzhou, Guangdong 510632, China
[2] Key Lab. of Optoelectronic Information and Sensing Technologies of Guangdong Higher Education Inst., Guangzhou, Guangdong 510632, China
来源：
Zhongguo Jiguang/Chinese Journal of Lasers | 2013年 / 40卷 / 12期
关键词：
Phase measurement;
D O I：
10.3788/CJL201340.1209001
中图分类号：
学科分类号：
摘要：
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