Surface roughness of Ni/Ti multilayers made by magnetron sputtering

被引:1
|
作者
Pan L. [1 ]
Zhu J. [1 ]
Wang X. [1 ]
Jiang L. [1 ]
Li H. [1 ]
Xu J. [1 ]
Zhang Z. [1 ]
Wang Z. [1 ]
Chen L. [1 ]
机构
[1] Institute of Precision Optical Engineering, Tongji University
关键词
Atomic force microscope; Neutron supermirror; Roughness; X-ray reflection;
D O I
10.3788/HPLPB20102206.1239
中图分类号
学科分类号
摘要
Nickel/titanium multilayers with different period of 10, 30, 50 and 75 were fabricated by DC magnetron sputtering. Grazing incidence X-ray measured reflectivity was used to characterize the interfacial roughness of the multilayers. To study the evolution law of surface roughness of Ni/Ti multilayers with different period numbers, atomic force microscope(AFM) was used to characterize the surfaces of the multilayers. The results show that surface roughness of Ni/Ti multilayers increases with the number of periods of the multilayers. As the number of periods increases from 10 to 75, the roughness increases from 0.8 nm to 1.69 nm. Fitting results show that surface roughness mainly varies with the number of periods as a cubic function.
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页码:1239 / 1242
页数:3
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