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Crack detection of industrial CT noisy image

被引：0
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作者：
Li, Zong-Jian [1 ,2 ]
Zeng, Li [1 ,3 ]
机构：
[1] ICT Research Center, Key Laboratory of Optoelectronic Technology and System of the Ministry of Education, Chongqing University, Chongqing 400044, China
[2] College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China
[3] College of Mathematics and Physics, Chongqing University, Chongqing 400044, China
来源：
Guangxue Jingmi Gongcheng/Optics and Precision Engineering | 2010年 / 18卷 / 02期
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摘要：
13
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页码：451 / 457
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